Factors Governing Tin Whisker Growth

English | 20 Sept. 2013| ISBN: 3319004697 | 145 Pages | PDF | 8 MB

Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (including satellite and defense sectors).

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