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VLSI Test Principles and Architectures: Design for Testability
Author: , Date: 2009-01-14, Bookmark and Share



Morgan Kaufmann | 2006-07-07 | ISBN: 0123705975 | 808 pages | PDF | 4,9 MB

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Download:

http://depositfiles.com/files/kt7mp5of3

http://www.uploading.com/files/ZD6CX8A7/VLSITePrin.zip.html

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